With the electron beam acting as the parent of LCLS X-ray pulses, electron bunch tailoring and diagnosis of the time-energy electron distribution are now in frequent use at the LCLS to allow temporal shaping and profiling of X-ray FEL output. For example, by either fully masking or partially spoiling the electron beam in time allows for the generation of tunable, truncated, < 10 fs X-ray pulses or pairs of pulses. To diagnose temporal and spectral properties at the femtosecond scale, both LCLS operators and users can now employ the X-band transverse deflecting mode cavity (XTCAV). This system streaks the spent electron beam in time in the dispersive electron dump to deduce the temporal properties of generated X-ray pulses. In this talk, we discuss the methods, capabilities, and limitations of these techniques, now regularly available to the LCLS user community.