Continuous Scan Capability at SSRL and Applications to X-ray Diffraction Experiments | |
Presenter | Chunlei Li |
Presentation Type | Poster |
Full Author List |
Chunlei Li, Andrew Kiss, Alex Garachtchenko, Yuriy Kolotovsky, Kevin Stone, Doug Van Campen, Jeff Corbett |
Affiliations |
East China University of Science and Technology |
Abstract |
Typical x-ray diffraction measurements are made by moving the detector to discrete positions in space and then measuring beam intensity at each stationary position. However, this discrete-step scanning method is time consuming,and may induce vibrations into the measurement system because the motors have to be accelerated and decelerated. Furthermore, information between the data points may be missed unless fine scanning is performed which further increases the total scan time. In order to improve the data acquisition efficiency, improve signal-to-noise ratio, and reduce vibration, an integrated continuous-scan system was developed at Stanford Synchrotron Radiation Light Source (SSRL). The continuous-scan system uses an in-house motor controller with integrated counter/timer, and commercially available signal detection hardware. |