X-ray Spectroscopy for Chemical Catalysis | |
Presenter | Bruce Ravel |
Presentation Type | Session |
Affiliations | NIST |
Abstract | In the 42 years since the seminal paper by Sayers, Stern, and Lytle explaining the interpretation of the X-ray-absorption fine-structure, XAFS has become one of the core competancies of all synchrotron facilities. During those four decades, XAS has been adopted as an essential measurement technique by a broad range of scientific disciplines. Today, the humble XAFS measurement remains relevant even as synchrotron methodology advances in complexity and sophistication. The continuing evolution of the XAFS technique demands the adoption of data format standards. In this talk, I present an overview of the charge of the IUCr XAFS commission's committee on data standardization and describe in detail the work already accomplished on the definition of a data interchange format for XAFS. |
Footnotes | |
Funding Acknowledgement |