| Sub-fs precision measurement of relative x-ray arrival time at LCLS | |
| Abstract ID | 25 |
| Presenter | Nick Hartmann |
| Presentation Type | Poster |
| Full Author List | |
| Affiliations | SLAC |
| Category | |
| Abstract | The most successful techniques to date for direct x-ray/optical cross-correlation are based on x-ray induced carrier dynamics in semiconductors. At LCLS both techniques, namely spatial and spectral encoding, are routinely implemented for correction of the timing jitter with a precision of sub-10 fs RMS. Here we report on a new cross-correlation technique that records the two-dimensional spectrogram of a supercontinuum optical pulse that is gated with the x-ray induced carrier dynamics in silicon nitride.The x-ray arrival time is imprinted in the spectrogram through the induced absorption and is consistently correlated with a timing precision better than 1fs; this is an order of magnitude better precision than either of the previous schemes. Our measurements show that there is no additional gain in signal strength by driving the induced absorption beyond an x-ray saturation fluence of 1 J/cm^2. |
| Footnotes | |
| Funding Acknowledgement | |